ASTM E2809-2013
在法醫油漆檢查中使用掃描電子顯微鏡/X射線光譜法的標準指南

Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations

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標準號

ASTM E2809-2013

發布日期

2013年

實施日期

廢止日期

無

中國標準分類號

A92

國際標準分類號

17.180.30 (Optical measuring instruments); 87.040

發布單位

US-ASTM

適用范圍

4.1x00a0;The SEM can be used to define and compare the layer structure of multilayered samples, the structure of individual layers, the bulk elemental composition of individual layers, and the elemental composition of individual particulate components within paints and coatings.

4.2x00a0;The test methods described in this guide may have some limitations. They include the inability to detect elements in trace concentrations, the need for a conductive coating of the sample, the inability to remove a sample from most embedding materials after analysis, and the discoloration of materials by irradiation.

4.3x00a0;Although quantitative and semiquantitative methods are available for EDS (see Guide E1508), they are not appropriate for most paint analyses because of the typical heterogeneity of paint. Application of quantitative methods is further complicated by an inability to predict what compounds may be present (see 7.12.1).

4.4x00a0;The information available from a specimen may diminish as its size is reduced and its condition degrades. The smaller a specimen is, the less valuable it becomes for association with a known because it may contain fewer characteristics of the original material. As specimen size is reduced, it may no longer be representative of the original material. This may also be true of a degraded sample.

4.5x00a0;This guide is intended to advise and assist laboratory analysts in the effective application of scanning electron microscopy to the analysis of paint evidence. It is intended to be applicable to most modern scanning electron microscopes typically used in the forensic laboratory.

4.6x00a0;It is not the intention of this guide to present comprehensive methods of SEM. It is necessary that the analyst have an understanding of SEM operation and general concepts of specimen preparation before using this guide. This information is available from manufacturersx2019; reference materials, training courses, and references such as Scanning Electron Microscopy and X-ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists (1).³

1.1x00a0;This guide is an outline of methods for scanning electron microscopy (SEM) intended for use by forensic paint examiners. This guide is intended to supplement information presented in Guide E1610.

1.2x00a0;The methods used by each examiner or laboratory or both depend upon sample size, sample suitability, and laboratory equipment.

1.3x00a0;The term x201c;scanning electron microscopyx201d; occasionally refers to the entire analytical system including energy dispersive X-ray spectrometry (EDS) or wavelength dispersive X-ray spectrometry (WDS) or both.

1.4x00a0;This guide does not cover the theoretical aspects of many of the t......

ASTM E2809-2013 中可能用到的儀器設備