This part of IEC 60512 is intended to be used as a basic specification. It contains basic test methods and procedures which, when required by the detail specification, are used for testing connectors within the scope of technical committee 48. They may also be used for similar devices when specified in a detail specification. The object of this standard is to establish test methods and measurement procedures for use in specifications for connectors. This standard is to be used in conjunction with the generic, sectional and detail specification which will select and prescribe the tests to be used, the required degree of severity for each of them and the permissible performance limits. The detail specification will also specify the deviations in procedure, which may be inevitable when applying a test to the type of component under consideration, and it will further specify any special procedures which may be required. In the event of conflict between this basic specification and any individual component specification, the requirements of the component specification will apply. NOTE 1 RF connectors will not be dealt with by this technical committee as they will be covered by technical committee 46, together with r.f. cables. NOTE 2 Sockets for components such as crystals or electronic tubes will be considered in co-operation with the relevant technical committee. NOTE 3 Safety requirements for switches will not be developed by this technical committee as they are covered by subcommittee 23J.
IEC 60512-1-2001由國際電工委員會 IX-IEC 發布于 2001-01。
IEC 60512-1-2001 在中國標準分類中歸屬于: L10 電子元件綜合,在國際標準分類中歸屬于: 31.220.10 插頭和插座裝置、連接器。
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