IEC 62899-402-1:2025 PRV 印刷電子 - 第402-1部分：可打印性 - 質量測量

適用范圍: This Final Draft International Standard is an up to 6 weeks' pre-release of the official publication. It is available for sale during its voting period: 2025-02-28 to 2025-04-11. By purchasing this FDIS now, you will automatically receive, in addition, the final publication. IEC 62899-402-1:2025 specifies the measurement methods of the width of line pattern and spaces between the line patterns in printed electronics. These printed line patterns are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for vertical variance in printed electronics. This edition includes the following significant technical changes with respect to the previous edition: a) The title is changed from 'Printability – Measurement of qualities – Pattern width' to 'Printability – Measurement of qualities – Line pattern width' b) The term 'pattern width' is specified as 'line pattern width'. c) The measurement method of line pattern space is included. d) The definition and measurement of inner/outer edge lines are removed.

IEC 62899-402-1:2025 PRV
印刷電子 - 第402-1部分：可打印性 - 質量測量 - 線形圖案寬度